Length measurement

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Length measurement, distance measurement, or range measurement (ranging) all refer to the many ways in which length, distance, or range can be measured. The most commonly used approaches are the rulers, followed by transit-time methods and the interferometer methods based upon the speed of light. Surveying is one ancient use of measuring long distances.

For tiny objects such as crystals and diffraction gratings, diffraction is used with X-ray light, or even electron beams. Measurement techniques for three-dimensional structures very small in every dimension use specialized instruments such as ion microscopy coupled with intensive computer modeling. These techniques are employed, for example, to measure the tiny features on wafers during the manufacture of chips.